Measuring and Characterizing

Peak Chip Performance due to leading-edge analysis methods

With our state-of-the-art measurement technology, many years of experience, and the continual integration of scientific insights, we offer comprehensive measurement and characterization capabilities. This supports both efficient development and optimization of your chips and the targeted research of application-specific innovations in terahertz sensing – delivering greater performance, quality, and reliability.

Entwicklung und Charakterisierung von Terahertzsensorik: Wafermessung unter dem Mikroskop mit elektrischen Präzisionssonden im Reinraum. Development and characterization of terahertz sensing: Wafer measurement under a microscope with precision electrical probes in a cleanroom.

Wafer measurement under the microscope. © Fraunhofer FHR

Your Benefits at a Glance

Comprehensive testing: From on-wafer to system characterization

Highest precision: Measurements up to 500 GHz

Rapid optimization: Early detection and elimination of vulnerabilities

Flexibility: Customized measurement setups for RF and photonics systems

Industry relevance: Reliable data for prototypes, pre-series, and production

Key Highlights of Our Measurement Competence

We analyze existing systems as well as new developments in detail—from on-wafer and on-chip characterization to far-field antenna measurements and validation under real-world operating conditions. The results feed back into our research and drive continuous performance improvements for innovative systems.

Photonics Characterization

Precise characterization of integrated optical circuits in the 1510–1640 nm wavelength range
Use of state-of-the-art measurement tools: polarimeter, Soleil-Babinet compensators, lock-in amplifiers, and low-noise voltage and current amplifiers

RF/THz Characterization

Analysis of integrated RF circuits: Amplifiers, couplers, attenuators, and passive components
Material characterization of dielectrics

Detailed signal and spectral analysis: noise behavior, frequency response, and signal distortion – flexible across multiple frequency ranges and operating temperatures

On-Wafer Metrology – precision and flexibility

Vector 4-port network analysis: From quasi-DC (70 kHz) to 145 GHz in a single setup
Waveguide-confined 2-port systems for vector network analysis:
- W-band (WR10): 75–110 GHz
- D-band (WR6.5): 110–170 GHz
- WR2.2 band: 325–500 GHz
Signal and spectral analysis: Direct measurements up to 110 GHz, extendable to 500 GHz with front-end mixers
In-situ characterization of bonded chips via network analysis up to 500 GHz
Noise measurements from 10 MHz to 67 GHz
Non-invasive antenna pattern measurements of integrated mm-wave antennas via spherical near-field (SNF) measurements – ultra-high precision, error-compensated, with no invasive connectors
Flexible operating temperatures: Standard -10 °C to +125 °C, extendable to -40 °C; cryogenic measurement capability to 4 K for on-chip and module characterization

Anechoic antenna measurement chamber

Spectral and network analysis up to 500 GHz
Time-domain measurements of multi-channel systems up to 65 GHz
Channel measurements of wireless systems
Material characterization: Non-destructive testing for research and quality assurance

Terahertzsensorik: Feldmesstechnik-Antennenarray mit zahlreichen Koaxialkabeln in einer elektromagnetisch abgeschirmten Kammer. Terahertz sensing: Field measurement antenna array with numerous coaxial cables inside an electromagnetically shielded chamber.

Typical Application Areas

Optimization of integrated RF and photonics circuits

Validation of prototypes and pre-series modules under real-world conditions

Antenna measurements for radar and communications systems

Material characterization for research and industrial quality assurance

System tests for complex terahertz sensor solutions

Optimize your chips and systems with us

With our measurement and characterization services, you will gain reliable data and precise insights into the behavior of your integrated RF and photonics circuits. These robust findings not only ensure the highest quality but also advance the research and development of innovative solutions – from prototypes to small-series production. In this way, we jointly support the creation of efficient and sustainable technologies.